Pattern classification and scene analysis [by] Richard O. Duda [and] Peter E. Hart.
Material type:
TextPublication details: NewDelhi, Wiley [c2006]Edition: 2nd EDDescription: xvii, 654 p. illus. 23 cmISBN: - 9788126511167
- 004.1 DUD
- Q327 .D83
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IIITDM Kurnool General Stacks | 004.1 DUD (Browse shelf(Opens below)) | Available | 0001301 | |
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"A Wiley-interscience publication."
Introduction --
Bayesian decision theory --
Maximum-likelihood and Bayesian parameter estimation --
Nonparametric techniques --
Linear discriminant functions --
Multilayer neural networks --
Stochastic methods --
Nonmetric methods --
Algorithm-independent machine learning --
Unsupervised learning and clustering --
Mathematical foundations.
It is a systematic account of the major topics in pattern recognition, based on the fundamental principles. It includes extensive examples.
Includes bibliographies.
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