Electronics : basic, analog and digital with Pspice (Record no. 2274)
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000 -LEADER | |
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fixed length control field | 12384nam a22001697a 4500 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20240618111023.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 240618b |||||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781420087079 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.381 |
Item number | SAB |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Sabah, Nassir H |
245 ## - TITLE STATEMENT | |
Title | Electronics : basic, analog and digital with Pspice |
Statement of responsibility, etc. | Nassir H. Sabah |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | BocaRaton |
Name of publisher, distributor, etc. | CRC press |
Date of publication, distribution, etc. | 2010 |
300 ## - PHYSICAL DESCRIPTION | |
Page number | xxxiii, 729 |
Dimensions | 26 cmp. |
505 ## - FORMATTED CONTENTS NOTE | |
Title | Basic Diode Circuits<br/>Overview<br/>Learning Objectives<br/>Ideal and Practical Diodes<br/>Ideal Diode<br/>Ideal Si pn Junction Diode<br/>Practical Diodes<br/>Incremental Diode Resistance<br/>Basic Analysis of Diode Circuits<br/>Piecewise Linear Approximation<br/>Bias Point<br/>Small-Signal Model<br/>Rectifier Circuits<br/>Half-Wave Rectifier<br/>Full-Wave Rectifier<br/>Smoothing of Output<br/>Capacitor-Input Filter<br/>Approximate Analysis of Capacitor-Input Filter<br/>Zener Voltage Regulator<br/>Voltage-Current Characteristic<br/>Analysis of Zener Regulator<br/>Load regulation and Line Regulation<br/>Diode Voltage Limiters<br/>Surge Protection<br/>Diode-Capacitor Circuits<br/>dc Restorer<br/>Voltage Multiplication<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Basic Principles of Semiconductors<br/>Excerpts from Wave Mechanics<br/>Some Basic Ideas<br/>Schrödinger’s Equation<br/>Wave Packets<br/>Free Atoms<br/>Energy Band Structure<br/>Electric Conduction in Semiconductors<br/>Electrons in a Periodic Potential<br/>Effective Mass<br/>Hole Conduction<br/>Density of Electron States<br/>Fermi-Dirac Distribution<br/>Intrinsic and Extrinsic Semiconductors<br/>Crystal Structure<br/>Intrinsic Semiconductor<br/>Extrinsic Semiconductors<br/>Electrochemical Potential<br/>Expression for Chemical Potential<br/>Expression for Electrochemical Potential<br/>Generalized Ohm’s Law<br/>State of Equilibrium<br/>Fermi Level and Electrochemical Potential<br/>Carrier Concentrations in Semiconductors<br/>Carrier Generation and Recombination<br/>Intrinsic Semiconductor<br/>Position of Fermi Level<br/>n-type Semiconductor<br/>p-type semiconductor<br/>Carrier Mobility<br/>Variation with Dopant Concentration<br/>Variation with Temperature<br/>Carrier Recombination<br/>Minority Carrier Lifetime<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>pn Junction and Semiconductor Diodes<br/>The pn Junction at Equilibrium<br/>Junction Potential<br/>Depletion Approximation<br/>The Biased pn Junction<br/>The pn Junction as a Rectifier<br/>Width of Depletion Region<br/>Charge Distributions and Currents under Bias<br/>Current-Voltage relation<br/>Charge-Current Relation<br/>pn Junction Capacitances<br/>Temperature Effects<br/>Junction Breakdown<br/>Semiconductor Photoelectric Devices<br/>Photoconductive Cell<br/>Photodiode<br/>Photocell<br/>Light-Emitting Diodes<br/>Tunnel Diode<br/>Contacts between Dissimilar Materials<br/>Metal-Metal Contacts<br/>Metal-Semiconductor Contacts<br/>Schottky Diode<br/>Heterojunction<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Semiconductor Fabrication<br/>Preparation of Silicon Wafer<br/>High-Purity Silicon<br/>Crystal Growth<br/>Wafer Production<br/>Oxidation<br/>Patterning Processes<br/>Preparation of Masks<br/>Lithography<br/>Etching<br/>Deposition Processes<br/>Ion Implantation<br/>Diffusion<br/>Chemical Vapor Deposition<br/>Metallization<br/>Clean Room Environment<br/>Packaging<br/>Types of Packages<br/>Fabrication of Simple Devices<br/>Resistors<br/>pn Junction Diodes<br/>Capacitors<br/>CMOS Fabrication<br/>Transistor Isolation<br/>Transistor Formation<br/>Silicon-on Insulator Technology<br/>Fabrication of Bipolar Junction Transistors<br/>Basic BJT Structure<br/>Modified BJT Structures<br/>BiCMOS<br/>Miscellaneous Topics<br/>SiGe Technology<br/>Crystal Defects<br/>Si-SiO2 Interface<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Field Effect Transistors<br/>Amplifiers<br/>Hypothetical Amplifying Device<br/>Basic Operation of the MOSFET<br/>Structure<br/>Operation of Enhancement-type MOSFET<br/>Current-Voltage Relations<br/>p-Channel MOS Transistor<br/>Small-Signal Operation<br/>Secondary Effects in MOSFETs<br/>Channel-Length Modulation<br/>Transconductance<br/>Overdrive Voltage<br/>Temperature Effects<br/>Breakdown<br/>Body Effect<br/>Capacitances<br/>Unity-Gain Bandwidth<br/>Short-Channel Effects<br/>Carrier Velocity Saturation and Hot Carriers<br/>Reduced Output Resistance and Threshold<br/>Other Effects<br/>Improved Performance<br/>Depletion-Type MOSFETs<br/>Diode Connection<br/>Complementary MOSFETs<br/>CMOS Amplifier<br/>CMOS Transmission Gate<br/>CMOS Inverter<br/>Junction Field Effect Transistor<br/>Structure<br/>Operation<br/>Current-Voltage Relation<br/>Metal-Semiconductor Field-Effect Transistor<br/>Structure<br/>Operation<br/>High-Mobility Devices<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Bipolar Junction Transistor<br/>Basic Operation of the BJT<br/>Common-Base dc Current Gains<br/>Typical Structure<br/>Common-Emitter Configuration<br/>Small-Signal Current Gains<br/>Small-Signal Equivalent Circuits<br/>Secondary Effects in BJTs<br/>Base-Width Modulation<br/>Hybrid-p Equivalent Circuit<br/>Variation of iC with vbe<br/>h-Parameter Equivalent Circuit<br/>Temperature Effects<br/>Breakdown<br/>Punchthrough<br/>BJT Capacitances<br/>Unity-Gain Bandwidth<br/>BJT Large-Signal Models<br/>Ebers-Moll Model<br/>Saturation Mode<br/>The BJT as a Switch<br/>Diode Connection<br/>Regenerative Pair<br/>Augmented Models<br/>Heterojunction Bipolar Transistor<br/>Noise in Semiconductors<br/>Comparison of BJTs and FETs<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Two-Port Circuits, Amplifiers, and Feedback<br/>Two-Port Circuits<br/>Equivalent Circuits<br/>Ideal Amplifiers<br/>Negative Feedback<br/>Feedback Amplifiers<br/>Ideal Operational Amplifier<br/>Noninverting Configuration<br/>Unity-Gain amplifier<br/>Signal-Flow Diagrams<br/>Inverting Configuration<br/>Integrator<br/>Differentiator<br/>Extraneous Signals<br/>Gain-Bandwidth Product<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises<br/>Single-Stage Transistor Amplifiers<br/>Transistor Biasing<br/>Biasing of Discrete Transistors<br/>Current Mirror<br/>BJT Current Mirror<br/>MOSFET Current Mirror<br/>Basic Amplifier Configurations<br/>General Considerations<br/>Common-Emitter Amplifier<br/>Common-Source Amplifier<br/>Common-Drain Amplifier<br/>Common-Collector Amplifier<br/>Common-Source Amplifier with Source Resistor<br/>Common-Emitter Amplifier with Emitter Resistor<br/>Common-Gate Amplifier<br/>Common-Base Amplifier<br/>High-Frequency Response<br/>Miller’s Theorem<br/>Poles and Zeros of Transfer Function<br/>Common Emitter/Source Amplifier<br/>Common Collector/Drain Amplifier<br/>Common-Emitter/Source Amplifier with Feedback Resistor<br/>Common-Base/Gate Amplifier<br/>Composite Transistor Connections<br/>Darlington Pair<br/>Common Collector-Common Emitter Cascade<br/>Cascode Amplifier<br/>MOSFET Cascode<br/>BJT Cascode<br/>BiCMOS Cascode<br/>Cascode Current Sources and Mirrors<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Multistage and Feedback Amplifiers<br/>Cascaded Amplifiers<br/>dc Level Shifting<br/>RC-Coupled Amplifiers<br/>Common-Source Amplifier<br/>Common-Emitter Amplifier<br/>Feedback Amplifiers<br/>Series-Shunt Feedback<br/>Series-Series Feedback<br/>Shunt-Series Feedback<br/>Shunt-Shunt Feedback<br/>Closed-Loop Stability<br/>Stability from Bode Magnitude Plots<br/>Frequency Compensation<br/>Feedback Oscillators<br/>Wien-Bridge Oscillator<br/>High-Q Oscillator<br/>Tuned Amplifiers<br/>LC Oscillators<br/>Crystal Oscillators<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Differential and Operational Amplifiers<br/>Differential Pair<br/>Basic Operation<br/>Transfer Characteristic<br/>Small-signal Differential Operation<br/>High-Frequency Response<br/>Small-signal Common-Mode Response<br/>High-Frequency Response<br/>Input Bias Currents<br/>Input Offset Voltage<br/>Current-Mirror Load<br/>MOSFET Differential Pair<br/>Two-Stage CMOS Op Amp<br/>Input Offset Voltage<br/>Voltage Gain and Output Swing<br/>Common Mode Response<br/>Frequency Response<br/>Slew Rate<br/>Folded Cascode CMOS Op Amp<br/>Common-Mode Input Range<br/>Output Voltage Swing<br/>Voltage Gain<br/>Frequency Response<br/>Slew Rate<br/>CMOS Current and Voltage Biasing<br/>Self Biasing<br/>BJT Op Amps<br/>Input Resistance and Bias Current<br/>Input Offset Voltage<br/>Some Basic Practical Op Amp Circuits<br/>Inverting and Noninverting Op Amp Circuits<br/>Integrator<br/>Difference amplifier<br/>Instrumentation Amplifier<br/>Switched-Capacitor Circuits<br/>Digital-Analog Conversion<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Power Amplifiers and Switches<br/>General Considerations<br/>Safe Operating Limits<br/>Thermal Resistance<br/>Thermal Stability<br/>Nonlinear Distortion<br/>Power-Conversion Efficiency<br/>Class A Operation<br/>Transformer Coupling<br/>Emitter Follower<br/>Class B Operation<br/>Class AB Operation<br/>Class C Operation<br/>Power Operational Amplifiers<br/>Power Switching<br/>Class D Amplifier<br/>Switched Regulated Supplies<br/>dc-to-ac Converters<br/>Power Diodes<br/>Power Transistors<br/>Bipolar Junction Transistors<br/>MOSFETs<br/>Insulated Gate Bipolar Transistor<br/>Power Latches<br/>Thyristor<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Basic Elements of Digital Circuits<br/>Digital Signals and Processing<br/>Digital Signals<br/>Boolean Algebra<br/>Logic Gates<br/>Gate Types<br/>CMOS Gate Examples<br/>Gate Performance<br/>Flip-Flops<br/>Basic Latch<br/>SR Latch<br/>JK Flip-Flop<br/>D Flip-Flop<br/>Digital System Memories<br/>Classification of Semiconductor Memories<br/>Organization of Random-Access Memory<br/>Read/Write Memory<br/>Static Memory Cell<br/>Dynamic Memory Cell<br/>Sense Amplifier and Precharge Circuit<br/>Row Decoder<br/>Column Decoder<br/>Read Only Memory<br/>Mask ROM<br/>Programmable ROM<br/>Erasable Programmable ROM<br/>Flash ROM<br/>Ferroelectric RAM<br/>Metallic Interconnect<br/>Capacitance<br/>Resistance<br/>Distributed Models<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises <br/>Digital Logic Circuit Families<br/>CMOS<br/>CMOS Inverter<br/>Static Behavior<br/>Noise Margins<br/>Propagation Delay<br/>Power Dissipation<br/>CMOS Gates<br/>NAND and NOR Gates<br/>CMOS Gate Design<br/>Effects of Sizing and Scaling<br/>Low-Power CMOS<br/>Summary<br/>Pseudo NMOS<br/>Static Operation<br/>Dynamic Operation<br/>Pass-Transistor Logic<br/>Dynamic Logic<br/>Basic Configuration<br/>Limitations of Dynamic Logic<br/>Domino Logic<br/>Pipelined Single-Phase Clock Architecture<br/>BiCMOS Logic<br/>Basic Operation<br/>Propagation Delay<br/>BiCMOS Gates<br/>Transistor-Transistor Logic<br/>Basic TTL Inverter<br/>Advanced Low-Power Schottky TTL<br/>Emitter-Coupled Logic<br/>Basic Circuit<br/>ECL 100K<br/>ECL Gates<br/>Summary of Main Concepts and Results<br/>Learning Outcomes<br/>Supplementary Examples and Topics on CD<br/>Problems and Exercises |
520 ## - SUMMARY, ETC. | |
Summary, etc. | Electronics: Basic, Analog, and Digital with PSpice does more than just make unsubstantiated assertions about electronics. Compared to most current textbooks on the subject, it pays significantly more attention to essential basic electronics and the underlying theory of semiconductors.<br/><br/>In discussing electrical conduction in semiconductors, the author addresses the important but often ignored fundamental and unifying concept of electrochemical potential of current carriers, which is also an instructive link between semiconductor and ionic systems at a time when electrical engineering students are increasingly being exposed to biological systems.<br/><br/>The text presents the background and tools necessary for at least a qualitative understanding of new and projected advances in microelectronics. The author provides helpful PSpice simulations and associated procedures (based on schematic capture, and using OrCAD® 16.0 Demo software), which are available for download. These simulations are explained in considerable detail and integrated throughout the book. The book also includes practical, real-world examples, problems, and other supplementary material, which helps to demystify concepts and relations that many books usually state as facts without offering at least some plausible explanation.<br/><br/>With its focus on fundamental physical concepts and thorough exploration of the behavior of semiconductors, this book enables readers to better understand how electronic devices function and how they are used. The book’s foreword briefly reviews the history of electronics and its impact in today’s world. |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | Dewey Decimal Classification |
Koha item type | Books |
952 ## - LOCATION AND ITEM INFORMATION (KOHA) | |
-- | 6635 |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Inventory number | Total Checkouts | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Currency | Koha item type |
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Dewey Decimal Classification | Non-fiction | IIITDM Kurnool | IIITDM Kurnool | ELECTRONICS COMMUNICATION ENGINEERING | 18.06.2024 | Technical Bureau India | 1295.00 | TB623 DT 6/6/2024 | 621.381 SAB | 0005673 | 18.06.2024 | 1295.00 | 18.06.2024 | INR | Books |